3 Review(s)

Each chapter has been revisited, obsolete material deleted and new developments included at various places so that the reader gets the best from the new edition. The new topics which have been included as separate chapters are - Scanning electron microscope and scanning probe microscope (Scanning tunneling microscope & Atomic force microscope). Particle size analyzers play an important role in research and development and for quality control in many industries such as pharmaceuticals, ceramics, cement, paints and emulsions etc. Realizing the need of the users in these areas, a new chapter on particle size analyzers and counters has been included. Salient Features: Coverage of modern trends in portable instrumentation A new chapter on particle size analysis Better visual impact of graphs and photographs of latest commercial equipment. About the Author Dr. R S Khandpur is former Director General of Science City, Kapurthala, a joint project of Government of India and Government of Punjab. A former Director General of Centre for Electronics Design and Technology of India of Ministry of Information and Communication Technology, Government of India. Dr. Khandpur is the founder Director of Centre for Development of Advanced Computing, Mohali (Punjab). He has served as scientist for 24 years in CSIR - CSIO (Central Scientific Instrument Organisation), Chandigarh as Head of Medical Instrument Division (1975 - 1989) and Electronics Divisions (1985-1989). He has been AICTE / NAE Distinguished Visiting Professor, Member IEEE, USA , Fellow, IETE and Member, Society for Engineering in Medicine and Biology, USA. He has authored 8 books of international repute, 4 of which has been published by McGraw Hill, USA. These books have gone into several reprints and new editions. He holds 7 patents for innovative designs and has published over 60 research and review papers.