Conceptual Modeling - ER 2000(English, Paperback, unknown)
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Thisvolumeprovidesacomprehensive,state-of-the-artsurveyofconceptual- deling. It includes invited papers, research papers, and abstracts of industrial presentationsgivenatER2000,the19thInternationalConferenceonConceptual Modeling,heldinSaltLakeCity,Utah. Continuinginitslongtraditionofattr- ting the leading researchers and practitioners in advanced information systems design and implementation, the conference provided a forum for presenting and discussing current research and applications in which the major emphasis was on conceptual modeling. The conference topics re?ected this strong conceptu- modeling theme while recognizing important, emerging developments resulting from recent technological advances. The call for papers for the research track resulted in the submission of 140 papersfromresearchersaroundtheworld. Ofthese,37wereselectedforinclusion in the program. The authors of these papers are from 14 countries.These papers represent a variety of topics including: - Database integration - Temporal and active database modeling - Database and data warehouse design techniques - Analysis patterns and ontologies - Web-based information systems - Business process modeling - Conceptual modeling and XML - Engineering and multimedia application modeling - Object-oriented modeling - Applying object-oriented technology - Quality in conceptual modeling - Application design using UML Three internationally recognized scholars in the area of conceptual modeling also submitted papers and delivered keynote speeches: - John Mylopoulos: From Entities and Relationships to Social Actors and - pendencies - Salvatore T. March: Re?ections on Computer Science and Information - stems Research - PhilipA. Bernstein:GenericModelManagement-WhyWeNeedItandHow to Get There In addition to the research papers and invited papers, the conference - cluded two workshops, two pre-conference full-day tutorials, four short tuto- als, four industrial sessions, and two provocative panel discussions.