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SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An ...
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DC/AC/RF Characteristic Fluctuation of N-Type Bulk FinFETs Induced by ...
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Effects of Varying the Fin Width, Fin Height, Gate Dielectric Material ...
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Test Structures for the Characterization of the Gate Resistance in 16 ...
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Ultra-Low-Power FinFETs-Based TPCA-PUF Circuit for Secure IoT Devices
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Micron stakes business on 3D NAND with new fab process - EE Times India
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A Review of the Gate-All-Around Nanosheet FET Process Opportunities
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A Conclusive Algorithm with Kink Effects for Fitting 3-D FinFET and ...
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SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An ...
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DC/AC/RF Characteristic Fluctuation of N-Type Bulk FinFETs Induced by ...
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Reliability Analysis of FinFET Based High Performance Circuits
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Photocathodic Protection of Cobalt Doped ZnO Nanorod Arrays for 316 ...
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Test Structures for the Characterization of the Gate Resistance in 16 ...
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The Effect of Eu Doping on Microstructure, Morphology and Methanal ...
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FIB-SEM Investigation of Laser-Induced Periodic Surface Structures and ...
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Fabrication of Subretinal 3D Microelectrodes with Hexagonal Arrangement
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A Review of the Gate-All-Around Nanosheet FET Process Opportunities
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